MEASUREMENTS OF THE REFRACTIVE-INDEX VARIATIONS WITH TEMPERATURE OF A PHOTOMONOMER

被引:8
作者
ANDERSON, RE
LIGHTMAN, AJ
机构
[1] Development Laboratory, University of Dayton, Dayton, OH, 45469-0140
来源
APPLIED OPTICS | 1991年 / 30卷 / 27期
关键词
STEREOLITHOGRAPHY; PHOTOMONOMER; INDEX OF REFRACTION;
D O I
10.1364/AO.30.003792
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The temperature dependence of the index of refraction of CIBATOOL XB5081, a commercial photomonomer commonly used for stereolithographic part building, is measured at wavelengths of 632.8, 514.5, and 488.0 nm.
引用
收藏
页码:3792 / 3793
页数:2
相关论文
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ANDERSON R, 1991, C LASERS ELECTROOPTI
[2]   REFRACTIVE-INDEX VARIATIONS WITH TEMPERATURE OF PMMA AND POLYCARBONATE [J].
CARIOU, JM ;
DUGAS, J ;
MARTIN, L ;
MICHEL, P .
APPLIED OPTICS, 1986, 25 (03) :334-336
[3]  
FLACH L, 1990, P SOLID FREEFORM FAB
[4]  
LIGHTMAN AJ, 1991, 1991 P AER ATL C WAR