APPLICATIONS OF WEAK BEAMS IN ELECTRON-MICROSCOPY

被引：4

作者：

HOWIE, A ^{[1
]}

STOBBS, WM ^{[1
]}

GAI, PL ^{[1
]}

机构：

[1] CAVENDISH LAB,CAMBRIDGE,ENGLAND

来源：

BULLETIN DE LA SOCIETE FRANCAISE MINERALOGIE ET DE CRISTALLOGRAPHIE | 1972年 / 95卷 / 06期

关键词：

D O I：

10.3406/bulmi.1972.6757

中图分类号：

O7 [晶体学];

学科分类号：

0702 [物理学]; 070205 [凝聚态物理]; 0703 [化学]; 080501 [材料物理与化学];

摘要：

引用

页码：690 / 699

页数：10

共 25 条

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[2]

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[7]

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[9]

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[10]

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