DETERMINATION OF THE DIFFUSION-COEFFICIENTS OF OXYGEN IN ZIRCONIUM BY MEANS OF XPS

被引：22

作者：

DEGONZALEZ, CO

GARCIA, EA

机构：

[1] Comisión Nacional de Energía Atómica, Departamento de Materiales, 1429 Buenos Aires

来源：

APPLIED SURFACE SCIENCE | 1990年 / 44卷 / 03期

关键词：

D O I：

10.1016/0169-4332(90)90052-2

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The diffusion coefficients of oxygen in zirconium were determined in the temperature range of 165-230°C. Thin oxide films were dissolved and the oxygen diffused by heating the samples at different temperatures. The evolution of film thicknesses was followed using XPS (X-ray photoelectron spectroscopy) techniques. A model was developed for film dissolution that related the evolution of film thicknesses with the diffusion coefficients of O in Zr. The equation D = 3.1 × 10-6 exp(-23750/RT) cm2/s is satisfied by the calculated coefficients. This expression is close to that obtained by Ritchie and Atrens [J. Nucl. Mater. 67 (1977) 254] after a regression analysis of several author's data and called RGB (grain boundary diffusion). The posibilities and limitations of XPS as a non-conventional technique for diffusion measurements are discussed. © 1990.

引用

页码：211 / 219

页数：9

共 11 条

[1]

BERANGER G, 1967, THESIS U PARIS, P49

[2]

DAVIS M, 1961, J I MET, V89, P172

[3]

DEBUIGNE J, 1967, MET CORROS-IND, V501, P186

[4] AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE SURFACE OXIDATION OF ZIRCONIUM [J].