HOLOGRAPHIC MEASUREMENTS OF OPTICALLY INDUCED REFRACTIVE INDEX INHOMOGENEITIES IN BISMUTH TITANATE

被引：12

作者：

LIN, LH

机构：

[1] Bell Telephone Laboratories, Inc., Murray Hill, N.J.

来源：

PROCEEDINGS OF THE IEEE | 1969年 / 57卷 / 02期

关键词：

D O I：

10.1109/PROC.1969.6952

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Optically induced refractive index inhomogeneities (optical damage) in single crystal bismuth titanate (Bi4Ti301J have been observed by the method of forming holograms inside the crystal. The maximum index change induced by light at 4880 wavelength is approximately 10 10-5 and lasts for a few minutes at-room temperature. © 1969 IEEE. All rights reserved.

引用

页码：252 / &

共 5 条

[1] OPTICALLY-INDUCED REFRACTIVE INDEX INHOMOGENEITIES IN LINBO3 AND LITAO3 - (FERROELECTRIC MATERIALS - NONLINEAR OPTICS - E) [J].