SCRATCH TEST OF TIC AND TIN FILMS DEPOSITED ON WC-CO ALLOYS

A scratch test has been performed on chemically vapor deposited (CVD) TiC and physically vapor deposited (PVD) TiN on WC-Co alloy substrates using the pyramidal indentator. Acoustic emission has been observed accompanied by cracking and detaching of the film at the interface. The AE signals increased abruptly at the critical load at which the detachment began to occur and were constant after critical loading. The scratching depth at the critical load was 1/2-3/5 of the film thickness, which means the indentor did not reach the interface.