ELECTROLYTIC CAPACITORS

[1] BAKISH R, 1968, ELECTROCHEM TECHNOL, V6, P192

[2] CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P11

[3] TEMPERATURE COEFFICIENT OF CAPACITANCE [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (09) : 1109 - &

[4] TECHNIQUE FOR A SCANNING ELECTRON MICROSCOPE STUDY OF ETCHED ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) : 1050 - &

[5] PURIFICATION OF TANTALUM ANODES DURING SINTERING [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1960, 107 (07) : 658 - 660

[6] SELECTION OF THIN FILM CAPACITOR DIELECTRICS [J]. THIN SOLID FILMS, 1968, 2 (04) : 273 - &

[7] HARROP PJ, 1970, HANDBOOK THIN FILM T, P161

[8] HOAR TP, 1959, MOD ASPECT ELECTROC, V2, P262

[9] JACKSON NF, 1968 1970 PLESS CO L

[10] ELECTROLYTIC ETCHING OF DENSE TANTALUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (05) : 442 - 445

[1] BAKISH R, 1968, ELECTROCHEM TECHNOL, V6, P192

[2] CAMPBELL DS, 1966, USE THIN FILMS PHYSI, P11

[3] TEMPERATURE COEFFICIENT OF CAPACITANCE [J]. JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1968, 1 (09) : 1109 - &

[4] TECHNIQUE FOR A SCANNING ELECTRON MICROSCOPE STUDY OF ETCHED ALUMINUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1969, 116 (07) : 1050 - &

[5] PURIFICATION OF TANTALUM ANODES DURING SINTERING [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1960, 107 (07) : 658 - 660

[6] SELECTION OF THIN FILM CAPACITOR DIELECTRICS [J]. THIN SOLID FILMS, 1968, 2 (04) : 273 - &

[7] HARROP PJ, 1970, HANDBOOK THIN FILM T, P161

[8] HOAR TP, 1959, MOD ASPECT ELECTROC, V2, P262

[9] JACKSON NF, 1968 1970 PLESS CO L

[10] ELECTROLYTIC ETCHING OF DENSE TANTALUM [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1961, 108 (05) : 442 - 445