THIRD-DERIVATIVE MODULATION SPECTROSCOPY WITH LOW-FIELD ELECTROREFLECTANCE

被引：1240

作者：

ASPNES, DE ^{[1
]}

机构：

[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA

来源：

SURFACE SCIENCE | 1973年 / 37卷 / 01期

关键词：

D O I：

10.1016/0039-6028(73)90337-3

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：418 / 442

页数：25

共 35 条

[1] HIGH-RESOLUTION INTERBAND-ENERGY MEASUREMENTS FROM ELECTROREFLECTANCE SPECTRA [J].

ASPNES, DE ;

ROWE, JE .

PHYSICAL REVIEW LETTERS, 1971, 27 (04) :188-&

[2] ASYMPTOTIC CONVOLUTION INTEGRAL FOR ELECTRIC FIELD EFFECTS ON INTERBAND DIELECTRIC FUNCTION [J].

ASPNES, DE ;

ROWE, JE .

SOLID STATE COMMUNICATIONS, 1970, 8 (14) :1145-&

[3] DIRECT VERIFICATION OF THIRD-DERIVATIVE NATURE OF ELECTROREFLECTANCE SPECTRA [J].

ASPNES, DE .

PHYSICAL REVIEW LETTERS, 1972, 28 (03) :168-&

[4]

ASPNES DE, 1971, B AM PHYS SOC, V16, P396

[5] LINEARIZED THIRD-DERIVATIVE SPECTROSCOPY WITH DEPLETION-BARRIER MODULATION [J].

ASPNES, DE .

PHYSICAL REVIEW LETTERS, 1972, 28 (14) :913-&

[6] INFLUENCE OF SPATIALLY DEPENDENT PERTURBATIONS ON MODULATED REFLECTANCE AND ABSORPTION OF SOLIDS [J].

ASPNES, DE ;

FROVA, A .

SOLID STATE COMMUNICATIONS, 1969, 7 (01) :155-159

[7] INTERBAND DIELECTRIC PROPERTIES OF SOLIDS IN AN ELECTRIC FIELD [J].

ASPNES, DE ;

HANDLER, P ;

BLOSSEY, DF .

PHYSICAL REVIEW, 1968, 166 (03) :921-&

[8] NONLINEAR OPTICAL SUSCEPTIBILITIES FROM ELECTROREFLECTANCE MOMENTS ANALYSIS [J].

ASPNES, DE .

PHYSICAL REVIEW LETTERS, 1971, 26 (23) :1429-&

[9] RESONANT NONLINEAR OPTICAL SUSCEPTIBILITY - ELECTROREFLECTANCE IN LOW-FIELD LIMIT [J].

ASPNES, DE ;

ROWE, JE .

PHYSICAL REVIEW B, 1972, 5 (10) :4022-&

[10] DIRECT OBSERVATION OF E0 AND E0 + DELTA0 TRANSITIONS IN SILICON [J].

ASPNES, DE ;

STUDNA, AA .

SOLID STATE COMMUNICATIONS, 1972, 11 (10) :1375-&

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