TOPOLOGICAL DEFECTS IN NON-HAUYAN CRYSTALLOGRAPHY - THE TWO-DIMENSIONAL CASE

被引:43
作者
KLEMAN, M
GEFEN, Y
PAVLOVITCH, A
机构
[1] TEL AVIV UNIV,SCH PHYS & ASTRON,IL-69978 TEL AVIV,ISRAEL
[2] CENS,SRMP,D TECH,F-91191 GIF SUR YVETTE,FRANCE
来源
EUROPHYSICS LETTERS | 1986年 / 1卷 / 02期
关键词
D O I
10.1209/0295-5075/1/2/004
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:61 / 69
页数:9
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