SCANNING FORCE MICROSCOPY OF NANOSTRUCTURED UNIAXIALLY ORIENTED ULTRA THIN-FILM SURFACES OF ISOTACTIC POLYSTYRENE

被引：12

作者：

JANDT, KD ^{[1
]}

ENG, LM ^{[1
]}

PETERMANN, J ^{[1
]}

FUCHS, H ^{[1
]}

机构：

[1] TU HAMBURG HARBURG,POLYMER COMPOSITES GRP,DENICKESTR 15,W-2100 HAMBURG 90,GERMANY

来源：

POLYMER | 1992年 / 33卷 / 24期

关键词：

ISOTACTIC POLYSTYRENE; SCANNING FORCE MICROSCOPY; SURFACE MORPHOLOGY; NANOSTRUCTURES; MORPHOLOGICAL DEFECTS;

D O I：

10.1016/0032-3861(92)90821-D

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

Surfaces of ultra thin films of isotactic polystyrene (iPS) drawn from the melt were investigated by scanning force microscopy (SFM). SFM micrographs of iPS surfaces exhibit the morphology of uniaxial orientation resulting from the preparation technique as well as structures pseudomorphic to regularly arranged shish crystals. Their diameters were approximately 60% larger compared to earlier results obtained from dark-field transmission electron microscopy investigations. Furthermore, different defects of the polymer surface morphology were observed. It is supposed that macromolecules of a lower orientational order cover the shish crystals (hair dressing model).

引用

页码：5331 / 5333

页数：3

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