ACCELERATED LIFE TESTING - STEP-STRESS MODELS AND DATA ANALYSES

被引：427

作者：

NELSON, W

机构：

来源：

关键词：

D O I：

10.1109/TR.1980.5220742

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：103 / 108

页数：6

共 16 条

[1] ALLEN WR, 1965, NOTES SOME STATISTIC
[2] APPLICATION OF EYRING MODEL TO CAPACITOR AGING DATA
ENDICOTT, HS
HATCH, BD
SOHMER, RG
[J]. IEEE TRANSACTIONS ON COMPONENT PARTS, 1965, CP12 (01): : 34 - &
[3] ENDICOTT HS, 1961, T AIEE POWER APPARAT, V80, P515
[4] ENDICOTT HS, 1961, 7TH P NAT S REL QUAL, P229
[5] HAHN GJ, 1967, STATISTICAL MODELS E
[6] MANN NR, 1974, METHODS STATISTICAL
[7] ANALYSIS OF RESIDUALS FROM CENSORED DATA
NELSON, W
[J]. TECHNOMETRICS, 1973, 15 (04) : 697 - 715
[8] SURVEY OF METHODS FOR PLANNING AND ANALYZING ACCELERATED TESTS
NELSON, W
[J]. IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1974, EL 9 (01): : 12 - 18
[9] NELSON WB, 1972, TIS72GEN009 GE CO CO
[10] NELSON WB, 1978, TIS79CRD262 GE CO CO