HIGH-RESOLUTION POLARIZING MICROSCOPE FOR OBSERVATION OF MAGNETIC STRUCTURES AT LOW-TEMPERATURES

被引：13

作者：

KIRCHNER, H ^{[1
]}

机构：

[1] SIEMENS AG,FORSCH LAB,MUNICH,WEST GERMANY

来源：

关键词：

D O I：

10.1063/1.1686138

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：379 / 382

页数：4

共 12 条

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[2] INTERMEDIATE STATE OF SOME SUPERCONDUCTORS [J].

DESORBO, W ;

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[3]

GOODMAN BB, 1966, CR ACAD SCI B PHYS, V262, P12

[4]

HAERING RR, 1963, SOLID STATE ELECTRON, V6, P1004

[5]

KASEMANN E, 1962, OPTIK STUTTG, V3, P161

KIRCHNER, H .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1971, 4 (02) :531-+

KIRCHNER, H .

KIRCHNER, H .

[9]

KIRCHNER H, 1968, 11 P INT C LOW TEMP, V2, P815

[10]

KIRCHNER HP, UNPUBLISHED