ELECTRON-SPECTROSCOPY OF CONDENSED MULTILAYERS - LINE-SHAPE CHANGES DUE TO BEAM DAMAGE AND EXCITATION MODE

被引:45
作者
HOLLOWAY, PH [1 ]
MADEY, TE [1 ]
CAMPBELL, CT [1 ]
RYE, RR [1 ]
HOUSTON, JE [1 ]
机构
[1] SANDIA LABS,ALBUQUERQUE,NM 87115
关键词
D O I
10.1016/0039-6028(79)90571-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Auger line-shape analysis, photoelectron spectroscopy, and thermal desorption spectroscopy have been used to study the effects of electron bombardment on condensed multilayers of (CH3)2O, CH3OH, and H2O. The data show that electron doses as low as 5 × 10-4 C/cm2 (a 0.5 mm diameter, 1 μA beam for 1 sec) can cause detectable damage. New chemical species are created in the condensed layer by this electron beam interaction, and the data suggest that water and hydrocarbons are the most abundant. Auger spectra excited by X-rays and by electrons were shown to be different both before and after electron damage. This difference probably results from shake-up or shake-off processes which are sensitive to the specific mode of core-level excitation. © 1979.
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页码:121 / 137
页数:17
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