QUANTITATIVE-EVALUATION OF THE OXYGEN-CONTENT IN YBA2CU3O7+DELTA EPITAXIALLY GROWN THIN-FILMS USING NEAR-INFRARED EXCITED RAMAN-SPECTROMETRY

被引：7

作者：

GUTTLER, B ^{[1
]}

DEWING, HL ^{[1
]}

BASU, RN ^{[1
]}

SCHIEL, D ^{[1
]}

机构：

[1] CENT GLASS & CERAM RES INST,CALCUTTA 700032,W BENGAL,INDIA

来源：

PHYSICA C | 1995年 / 251卷 / 1-2期

关键词：

D O I：

10.1016/0921-4534(95)00405-X

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The oxygen content of YBa2Cu3O7-delta epitaxially grown thin films can be quantitatively evaluated from variations of the scattering efficiencies of lattice vibrations as measured by near-infrared excited Raman spectrometry. An empirical procedure allows an accurate (< +/- 0.03 delta for delta less than or equal to 0.42), absolute and non-destructive measurement to be made to a spatial resolution in the micrometer range under ambient conditions, without reference measurements or special sample preparation and on a short time scale. The method is independent of kinetic ordering effects and laser-induced photoconductivity.

引用

页码：165 / 170

页数：6

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