A NOVEL 24-GHZ BANDWIDTH COAXIAL PROBE

被引：19

作者：

RANIERI, VA

DEUTSCH, A

KOPCSAY, GV

ARJAVALINGAM, G

机构：

[1] IBM Research Division, Thomas J. Watson Research Center, Yorktown Heights

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1990年 / 39卷 / 03期

关键词：

D O I：

10.1109/19.106281

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE

引用

页码：504 / 507

页数：4

共 8 条

[1]

CARLSTON DE, 1985, MICROWAVE J JAN

[2]

Hanson E. R., 1987, Proceedings of the 1987 IEEE International Conference on Computer Design: VLSI in Computers and Processors - ICCD '87 (Cat. No.87CH2473-7), P472

[3]

Kopcsay G. V., 1987, Proceedings of the SPIE - The International Society for Optical Engineering, V795, P108

[4] A THICK-FILM COPLANAR PROBE FOR TIME DOMAIN MEASUREMENTS [J].