CONVERSION-ELECTRON EXTENDED X-RAY ABSORPTION FINE-STRUCTURE OF ION-IMPLANTED NANOCRYSTALLINE EVAPORATED-FILMS

被引：11

作者：

JAOUEN, M ^{[1
]}

BOUILLAUD, P ^{[1
]}

GIRARDEAU, T ^{[1
]}

CHARTIER, P ^{[1
]}

MIMAULT, J ^{[1
]}

TOURILLON, G ^{[1
]}

机构：

[1] LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1990年 / 2卷 / 41期

关键词：

D O I：

10.1088/0953-8984/2/41/001

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Extended X-ray absorption fine-structure (EXAFS) measurements of evaporated and ion-implanted Fe-Co thin films have been obtained by using the conversion-electron detection technique. Experiments were performed on films 700 AA thick in order to get some structural information which may explain their high resistivity value and unusual behaviour after ion-irradiation. Compared with bulk Fe-Co, the electron-beam-evaporated sample yields a damping of the EXAFS signals. The authors show that this effect is correlated to the nanocrystalline character of the sample so obtained. A quantitative analysis provides an estimation of the grain boundary fraction. Electrical resistivity and EXAFS results suggest that implantations of Fe-Co nanocrystals with heavy ions locally smooth out the insulating effect of the grain boundary but increase the damage produced in the crystalline structure.

引用

页码：8113 / 8122

页数：10

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