HIGH-RESOLUTION ELECTRON-MICROSCOPY OF CERAMIC INTERFACES

被引:5
作者
ISHIDA, Y
HAGEGE, S
ICHINOSE, H
TAKAHASHI, Y
机构
来源
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE | 1989年 / 12卷 / 03期
关键词
D O I
10.1002/jemt.1060120307
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
引用
收藏
页码:244 / 251
页数:8
相关论文
共 13 条
[1]   STRUCTURE AND COMPOSITION ANALYSIS OF SILICON ALUMINUM OXYNITRIDE POLYTYPES BY COMBINED USE OF STRUCTURE IMAGING AND MICROANALYSIS [J].
BANDO, Y ;
MITOMO, M ;
KITAMI, Y ;
IZUMI, F .
JOURNAL OF MICROSCOPY, 1986, 142 :235-246
[2]  
Bourret A., 1986, P JIMIS S, V1, P125
[3]   STRUCTURAL-ANALYSIS OF PLANAR DEFECTS IN WURTZITE TYPE ALUMINUM NITRIDE [J].
HAGEGE, S ;
TANAKA, S ;
ISHIDA, Y .
JOURNAL OF THE JAPAN INSTITUTE OF METALS, 1988, 52 (12) :1192-1198
[4]  
HAGEGE S, 1988, J CERAM SOC JAPAN IN, V96, P1093
[5]   A STUDY OF MICROSTRUCTURES OF GRAIN-BOUNDARIES IN SINTERED FE77ND15B8 PERMANENT-MAGNET BY HIGH-RESOLUTION ELECTRON-MICROSCOPY [J].
HIRAGA, K ;
HIRABAYASHI, M ;
SAGAWA, M ;
MATSUURA, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1985, 24 (06) :699-703
[6]  
ICHINOSE H, 1988, CERAMIC MICROSTRUCTU, P255
[7]  
ISHIDA Y, 1987, J ELECTRON MICROSC, V36, P251
[8]  
ISHIDA Y, 1988, P MRS RENO, V122, P515
[9]  
KITAZAWA K, 1987, FAL P MRS C HIGH TEM
[10]  
MENG RL, 1987, PHYS REV LETT, V58, P908