OBSERVATION OF THE TRANSVERSE OPTICAL PHONON MODE IN CDS FILM AT 4880-A EXCITATION

被引:5
作者
DAI, CM
CHUU, DS
机构
[1] NATL CHIAO TUNG UNIV, DEPT ELECTROPHYS, HSINCHU 30050, TAIWAN
[2] IND TECHNOL RES INST, ELECTR RES & SERV ORG, HSINCHU 31015, TAIWAN
关键词
D O I
10.1063/1.350995
中图分类号
O59 [应用物理学];
学科分类号
摘要
The transverse-optical (TO) phonon mode in a CdS film with a thickness less than 410 angstrom is observed at 4880 angstrom excitation wavelength which is above the band gap of CdS bulk (2.42 eV) at room temperature. This phenomenon is ascribed to the size quantization of the free carrier in the low-dimensional thin-film structure. The quantum size effect causes a blue shift of the band gap in the as-deposited CdS thin film. The Raman shift of the TO mode of CdS film is around 220 cm-1. The softening energy of the TO phonon mode is about 8 cm-1. It was found that this softening energy is independent of the film thickness.
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页码:3056 / 3058
页数:3
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