ATOMIC-FORCE MICROSCOPY OF THIN AG FILMS - RELATIONSHIP BETWEEN MORPHOLOGY AND OPTICAL-PROPERTIES

被引：24

作者：

ROARK, SE

ROWLEN, KL

机构：

[1] Department of Chemistry and Biochemistry, University of Colorado, Boulder

来源：

CHEMICAL PHYSICS LETTERS | 1993年 / 212卷 / 1-2期

关键词：

D O I：

10.1016/0009-2614(93)87106-D

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Atomic force microscopy is used to quantify the surface morphology of thin Ag films. The three-dimensional nature of atomic force micrographs allows for previously unavailable direct measurement of mean particle height, radius, aspect ratio, and the distribution in these parameters. These measurements allow for comparison of surface morphology, optical properties and thin metal film optical theory.

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页码：50 / 56

页数：7

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