PARAMAGNETIC NI(IO3)2.2H2O - CRYSTAL-STRUCTURE OF TRANSITION-METAL IODATES .1.

被引：29

作者：

ABRAHAMS, SC

BERNSTEI.JL

ELEMANS, JBA

VERSCHOO.GC

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

[2] KAMERLINGH ONNES LAB,LEIDEN,NETHERLANDS

[3] RIJKS UNIV LEIDEN,GORLAEUS LAB,LAIDEN,NETHERLANDS

来源：

JOURNAL OF CHEMICAL PHYSICS | 1973年 / 59卷 / 04期

关键词：

D O I：

10.1063/1.1680287

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：2007 / 2018

页数：12

共 29 条

[1] INDICATORS OF ACCURACY IN STRUCTURE FACTOR MEASUREMENT
ABRAHAMA.SC
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1969, A 25 : 165 - &
[2] Crystal Structure of the Transition-Metal Molybdates. I. Paramagnetic Alpha-MnMoO(4)
Abrahams, S. C.
Reddy, J. M.
[J]. JOURNAL OF CHEMICAL PHYSICS, 1965, 43 (07) : 2533 - 2543
[3] TRANSITION-METAL IODATES .2. CRYSTALLOGRAPHIC, MAGNETIC, AND NONLINEAR OPTIC SURVEY OF 3D IODATES
ABRAHAMS, SC
SHERWOOD, RC
BERNSTEIN, JL
NASSAU, K
[J]. JOURNAL OF SOLID STATE CHEMISTRY, 1973, 7 (02) : 205 - 212
[4] ACCURACY OF AN AUTOMATIC DIFFRACTOMETER . MEASUREMENT OF SODIUM CHLORIDE STRUCTURE FACTORS
ABRAHAMS, SC
BERNSTEIN, JL
[J]. ACTA CRYSTALLOGRAPHICA, 1965, 18 : 926 - +
[5] CRYSTAL STRUCTURE OF PARAMAGNETIC DYMN2O5 AT 298 DEGREES K
ABRAHAMS, SC
BERNSTEIN, JL
[J]. JOURNAL OF CHEMICAL PHYSICS, 1967, 46 (10) : 3776 - +
[6] AUTOMATIC APERTURE CONTROL FOR BALANCED FILTER X-RAY DIFFRACTOMETRY
ABRAHAMS, SC
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1963, 34 (11) : 1279 - &
[7] PROGRAMMED ELECTRONIC X-RAY AUTOMATIC DIFFRACTOMETER
ABRAHAMS, SC
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1962, 33 (09) : 973 - &
[8] NORMAL PROBABILITY PLOT ANALYSIS OF ERROR IN MEASURED AND DERIVED QUANTITIES AND STANDARD DEVIATIONS
ABRAHAMS, SC
KEVE, ET
[J]. ACTA CRYSTALLOGRAPHICA SECTION A-CRYSTAL PHYSICS DIFFRACTION THEORETICAL AND GENERAL CRYSTALLOGRAPHY, 1971, A 27 (MAR1) : 157 - &
[9] APPLICATION OF NORMAL PROBABILITY PLOT ANALYSIS TO LUTETIUM ORTHOBORATE STRUCTURE FACTORS AND PARAMETERS
ABRAHAMS, SC
BERNSTEI.JL
KEVE, ET
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1971, 4 (AUG1) : 284 - &
[10] A SURVEY OF PRECISION LATTICE PARAMETER MEASUREMENTS AS A TOOL FOR CHARACTERIZATION OF SINGLE-CRYSTAL MATERIALS
BARNS, RL
[J]. MATERIALS RESEARCH BULLETIN, 1967, 2 (03) : 273 - &

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