SCANNING-TUNNELING-MICROSCOPY CURRENT-VOLTAGE CHARACTERISTICS OF CARBON NANOTUBES

被引：21

作者：

RIVERA, W

PEREZ, JM

RUOFF, RS

LORENTS, DC

MALHOTRA, R

LIM, S

RHO, YG

JACOBS, EG

PINIZZOTTO, RF

机构：

[1] SRI INT,MENLO PK,CA 94025

[2] UNIV CAUCA,POPAYAN,COLOMBIA

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1995年 / 13卷 / 02期

关键词：

D O I：

10.1116/1.588374

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Scanning tunneling microscopy (STM) has been used to obtain images and current-voltage (I-V) curves of carbon nanotubes produced by arc discharge of carbon electrodes. The STM I-V curves indicate that carbon nanotubes with diameters from 2.0 to 5.1 nm have a metallic density of states. Using STM, we also observe nanometer-size graphene sheets which are four graphite layers thick. The STM images of carbon nanotubes are in good agreement with transmission electron microscope images.

引用

页码：327 / 330

页数：4

共 18 条

[1] LUMINESCENCE IN SCANNING TUNNELING MICROSCOPY ON III-V NANOSTRUCTURES [J].