STRETCHED-EXPONENTIAL DECAY LAWS OF GENERAL DEFECT DIFFUSION-MODELS

被引:3
作者
ITO, HM
OGURA, Y
TOMISAKI, M
机构
[1] SAGA UNIV, FAC SCI, DEPT MATH, SAGA 840, JAPAN
[2] NARA WOMENS UNIV, FAC SCI, DEPT MATH, NARA 630, JAPAN
关键词
STRETCHED-EXPONENTIAL; RELAXATION; DEFECT DIFFUSION;
D O I
10.1007/BF01060081
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We calculate a correlation function of a dipole which flips upon contact with one of the defects making generally non-Gaussian diffusions. Other than the memory effect in the fractal random walk model, the non-Gaussian property can be an origin of the stretched-exponential law of the correlation function.
引用
收藏
页码:563 / 582
页数:20
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