TOF SIMS AND XPS STUDY OF THE INTERACTION OF HYDROLYZED GAMMA-AMINOPROPYLTRIETHOXYSILANE WITH E-GLASS SURFACES

The interaction of E-glass surfaces with hydrolysed gamma-aminopropyltriethoxysilane (HAPS) has been studied by time-of-flight secondary ion mass spectrometry (TOF SIMS) and X-ray photoelectron spectroscopy (XPS). The SIMS spectrum was found to consist of four series of fragmentation patterns, two of which could be assigned to the poly(aminosiloxane). The remaining two series were consistent with the well-known fragmentation of polydimethylsiloxane. Using aqueous extraction procedures, it was possible to show that the largest observable fragment increased in size after treatment with warm water but subsequently decreased again after hot water extraction. This is considered to demonstrate the removal of low molecular weight oligomeric species overlying a crosslinked network of graded density. The positive aluminium ion intensity remained strong, suggesting its incorporation into the silane film. XPS analysis confirmed the incorporation of aluminium ions from the substrate into the coating.