共 14 条
- [1] REQUIREMENTS CONTRIBUTING TO THE DESIGN OF DEVICES USED IN CORRECTING ELECTRON LENSES [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1954, 5 (AUG): : 294 - 299
- [2] 2 NEW SIMPLIFIED SYSTEMS FOR THE CORRECTION OF SPHERICAL ABERRATION IN ELECTRON LENSES [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (03): : 156 - 164
- [3] ARCHARD GD, 1955, 1954 P INT C EL MICR
- [4] GEGENFELDFILTER FUR ELEKTRONENBEUGUNG UND ELEKTRONENMIKROSKOPIE [J]. ZEITSCHRIFT FUR PHYSIK, 1953, 134 (02): : 156 - 164
- [5] ELECTRON-OPTICAL SYSTEMS WITH HELICAL AXIS [J]. PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1951, 64 (375): : 244 - 255
- [6] GABOR D, 1944, ELECTRON MICROSCOPE, pCH6
- [7] GLASER W, 1954, OPTIK, V11, P422
- [8] THE ADAPTATION OF AN ELECTRON MICROSCOPE FOR REFLEXION AND SOME OBSERVATIONS ON IMAGE FORMATION [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1953, 4 (AUG): : 239 - 244
- [9] KUSHNIR YM, 1951, B ACAD SCI USSR, V15, P303
- [10] LEONHARD F, 1954, Z NATURFORSCH A, V9, P1019