ADJUSTMENT OF A STEM INSTRUMENT BY USE OF SHADOW IMAGES

被引:45
作者
COWLEY, JM
机构
[1] Department of Physics, Arizona State University, Tempe
基金
美国国家科学基金会;
关键词
D O I
10.1016/S0304-3991(79)80018-2
中图分类号
TH742 [显微镜];
学科分类号
摘要
The shadow image formed in a scanning transmission electron microscopy (STEM) instrument when no objective aperture is used may provide a convenient means for the alignment of the instrument column, for the correction of astigmatism, for focussing and for calibration of the various instrumental parameters including defocus and spherical aberration. The procedures are illustrated by shadow images recorded from a fluorescent screen in an HB5 instrument, viewed by means of a television camera. © 1979 North-Holland Publishing Company.
引用
收藏
页码:413 / 418
页数:6
相关论文
共 4 条
  • [1] COWLEY JM, 1978, SCANNING ELECTRON MI, V1, P53
  • [2] COWLEY JM, 1979, ULTRAMICROSCOPY, V3, P433
  • [3] SELECTED-AREA DIFFRACTION IN SHADOW ELECTRON-MICROSCOPE
    DOWELL, WCT
    [J]. ZEITSCHRIFT FUR NATURFORSCHUNG SECTION A-A JOURNAL OF PHYSICAL SCIENCES, 1976, 31 (11): : 1435 - &
  • [4] SPENCE JCH, 1978, OPTIK, V50, P129