RECENT DEVELOPMENTS IN LORENTZ ELECTRON MICROSCOPY

被引:5
作者
COHEN, MS
机构
[1] M.I.T. Lincoln Laboratory, Lexington Mass.
关键词
D O I
10.1109/TMAG.1968.1066169
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several different methods of obtaining contrast for electron microscopy of magnetic specimens are reviewed. For the investigation of magnetization ripple and the structure of domain walls in magnetic films, two questions must be considered the correct wave optical interpretation of Lorentz micrographs and the experimental attainment of coherenc of the electron beam. Both questions have been sufficiently explored so that experimental results on magnetic film microstructure may be expected in the near future. Copyright © 1968 by The Institute of Electrical and Electronics Engineers, Inc.
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页码:48 / &
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