MULTIPLE IONIZATION OF HE NE AND AR BY 2-16KEV ELECTRONS

被引：91

作者：

VANDERWIEL, MJ

ELSHERBI.TM

VRIENS, L

机构：

[1] FOM-Instituut voor Atoom-en Molecuulfysica, Amsterdam

来源：

PHYSICA | 1969年 / 42卷 / 03期

关键词：

D O I：

10.1016/0031-8914(69)90033-0

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Relative abundances of multiply charged ions formed by electron impact (2-16 keV) on some noble gases were measured using a charge analyzer with 100% transmission Large discrepancies exist between our values and those obtained in low-transmission mass spectrometers. Cross sections were determined by normalization on the absolute gross ionization cross sections of Schram et al. The measured proportionality constants of the E-1el ln Eel-term in the cross section are compared with those obtained from an analysis of photoionization data. The agreement with our values is good if besides one-electron ejection from an inner shell also the multiple electron ejection from the outer shell is taken into account. © 1969.

引用

页码：411 / +

页数：1

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