PHOTOACOUSTIC MICROSCOPY OF AN INTEGRATED-CIRCUIT

被引：34

作者：

FAVRO, LD

KUO, PK

POUCH, JJ

THOMAS, RL

机构：

来源：

APPLIED PHYSICS LETTERS | 1980年 / 36卷 / 12期

关键词：

D O I：

10.1063/1.91662

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：953 / 954

页数：2

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[1] OPTOACOUSTIC PHASE-ANGLE MEASUREMENT FOR PROBING A METAL
BUSSE, G
[J]. APPLIED PHYSICS LETTERS, 1979, 35 (10) : 759 - 760
[2] PHOTOACOUSTIC SIGNAL CHANGES ASSOCIATED WITH VARIATIONS IN SEMICONDUCTOR CRYSTALLINITY
MCCLELLAND, JF
KNISELEY, RN
[J]. APPLIED PHYSICS LETTERS, 1979, 35 (08) : 585 - 587
[3] SCANNING PHOTOACOUSTIC MICROSCOPY FOR NON-DESTRUCTIVE EVALUATION
POUCH, JJ
THOMAS, RL
WONG, YH
SCHULDIES, J
SRINIVASAN, J
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1980, 70 (05) : 562 - 564
[4] SUBSURFACE FLAW DETECTION IN METALS BY PHOTOACOUSTIC MICROSCOPY
THOMAS, RL
POUCH, JJ
WONG, YH
FAVRO, LD
KUO, PK
ROSENCWAIG, A
[J]. JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) : 1152 - 1156
[5] SUBSURFACE STRUCTURES OF SOLIDS BY SCANNING PHOTOACOUSTIC MICROSCOPY
WONG, YH
THOMAS, RL
POUCH, JJ
[J]. APPLIED PHYSICS LETTERS, 1979, 35 (05) : 368 - 369
[6] SURFACE AND SUBSURFACE STRUCTURE OF SOLIDS BY LASER PHOTOACOUSTIC SPECTROSCOPY
WONG, YH
THOMAS, RL
HAWKINS, GF
[J]. APPLIED PHYSICS LETTERS, 1978, 32 (09) : 538 - 539