RECENT ADVANCES IN SECONDARY ION MASS-SPECTROMETRY (SIMS) FOR POLYMER SURFACE-ANALYSIS

被引：63

作者：

BRIGGS, D

机构：

来源：

BRITISH POLYMER JOURNAL | 1989年 / 21卷 / 01期

关键词：

D O I：

10.1002/pi.4980210103

中图分类号：

O63 [高分子化学（高聚物）];

学科分类号：

070305 ; 080501 ; 081704 ;

摘要：

引用

收藏

页码：3 / 15

页数：13

相关论文

共 34 条

[1] ANALYSIS OF SUBMONOLAYERS ON SILVER BY NEGATIVE SECONDARY ION EMISSION
BENNINGHOVEN, A
[J]. PHYSICA STATUS SOLIDI, 1969, 34 (02): : K169 - +
[2] TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMERS IN THE MASS RANGE 500-10000
BLETSOS, IV
HERCULES, DM
VANLEYEN, D
BENNINGHOVEN, A
[J]. MACROMOLECULES, 1987, 20 (02) : 407 - 413
[3] ANALYSIS OF POLYMER SURFACES BY SIMS .1. AN INVESTIGATION OF PRACTICAL PROBLEMS
BRIGGS, D
WOOTTON, AB
[J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (03) : 109 - 115
[4] ANALYSIS OF POLYMER SURFACES BY SIMS .5. THE EFFECTS OF PRIMARY ION MASS AND ENERGY ON SECONDARY ION RELATIVE INTENSITIES
BRIGGS, D
HEARN, MJ
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1985, 67 (01): : 47 - 56
[5] BRIGGS D, 1988, POLYM COMMUN, V29, P6
[6] BRIGGS D, 1986, SURF INTERFACE ANAL, V9, P391
[7] BRIGGS D, 1987, POLYM COMMUN, V28, P307
[8] SUB-MICRON MOLECULAR IMAGING - A VIABILITY STUDY BY TIME-OF-FLIGHT SIMS
BRIGGS, D
HEARN, MJ
[J]. SURFACE AND INTERFACE ANALYSIS, 1988, 13 (04) : 181 - &
[9] ANALYSIS OF POLYMER SURFACES BY SIMS .7. HOMOPOLYMER AND COPOLYMER NYLONS
BRIGGS, D
[J]. ORGANIC MASS SPECTROMETRY, 1987, 22 (02): : 91 - 97
[10] INTERACTION OF ION-BEAMS WITH POLYMERS, WITH PARTICULAR REFERENCE TO SIMS
BRIGGS, D
HEARN, MJ
[J]. VACUUM, 1986, 36 (11-12) : 1005 - 1010

← 1 2 3 4 →