TILTING AND ROTATING SPECIMEN STAGE FOR ELECTRON MICROSCOPY AND ELECTRON DIFFRACTION

被引:2
作者
BURGE, RE
MUNDEN, HR
机构
来源
JOURNAL OF SCIENTIFIC INSTRUMENTS | 1960年 / 37卷 / 06期
关键词
D O I
10.1088/0950-7671/37/6/307
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:199 / 201
页数:3
相关论文
共 3 条
[1]   A 3-STAGE ELECTRON MICROSCOPE WITH STEREOGRAPHIC DARK FIELD, AND ELECTRON DIFFRACTION CAPABILITIES [J].
HAINE, ME ;
PAGE, RS ;
GARFITT, RG .
JOURNAL OF APPLIED PHYSICS, 1950, 21 (02) :173-182
[2]   THE APPLICATION AND LIMITATIONS OF THE EDGE-DIFFRACTION TEST FOR ASTIGMATISM IN THE ELECTRON MICROSCOPE [J].
HAINE, ME ;
MULVEY, T .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1954, 31 (09) :326-332
[3]   EINE OBJEKTKAMMER MIT UNIVERSELL BEWEGLICHEM PRAPARATTISCH FUR ELEKTRONENBEUGUNGSUNTERSUCHUNGEN [J].
RIECKE, WD ;
STOCKLEIN, F .
ZEITSCHRIFT FUR PHYSIK, 1959, 156 (02) :163-178