DETERMINATION OF GLITCHES IN SOFT-X-RAY MONOCHROMATOR CRYSTALS

被引:18
作者
VANDERLAAN, G
THOLE, BT
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D O I
10.1016/0168-9002(88)90995-3
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:515 / 521
页数:7
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