LOW-ENERGY-ELECTRON-DIFFRACTION INTENSITIES FROM AG[001] .2. THEORY

被引：25

作者：

JEPSEN, DW

MARCUS, PM

JONA, F

机构：

[1] IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA

[2] SUNY, DEPT MAT SCI, STONY BROOK, NY 11790 USA

来源：

PHYSICAL REVIEW B | 1973年 / 8卷 / 12期

关键词：

D O I：

10.1103/PhysRevB.8.5523

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5523 / 5531

页数：9

共 24 条

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[7] LOW-ENERGY-ELECTRON DIFFRACTION FROM SEVERAL SURFACES OF ALUMINUM [J].

JEPSEN, DW ;

JONA, F ;

MARCUS, PM .

PHYSICAL REVIEW B, 1972, 6 (10) :3684-&

[8] ACCURATE CALCULATION OF LOW-ENERGY ELECTRON-DIFFRACTION SPECTRA OF AL BY LAYER-KORRINGA-KOHN-ROSTOKER METHOD [J].

JEPSEN, DW ;

MARCUS, PM ;

JONA, F .

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[9]

JEPSEN DW, 1973, SURF SCI, V39, P27

[10]

JEPSEN DW, 1971, COMPUTATIONAL METHOD

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