HIGH-PRECISION PLANAR WAVE-GUIDE PROPAGATION LOSS MEASUREMENT TECHNIQUE USING A FABRY-PEROT CAVITY

被引：65

作者：

FEUCHTER, T

THRISTRUP, C

机构：

[1] Mikroelektronik Centret Technical University of Denmark, East DK-2800, Lyngby

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1994年 / 6卷 / 10期

关键词：

Cavity resonators - Computational methods - Dielectric materials - Fabry-Perot interferometers - Light modulation - Light polarization - Light reflection - Mirrors - Optical coatings - Optical fibers - Optical waveguides - Silica;

D O I：

10.1109/68.329652

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A high precision measurement technique for characterizing the propagation loss in silica low-loss optical waveguides, based on measuring the contrast of a Fabry-Perot cavity, is demonstrated. The cavity consists of the waveguide coupled to two polarization-maintaining fibers, each end facet coated with dielectric mirrors, leaving the reflectivity as an adjustable parameter. The contrast is measured by modulating the cavity length without influence on the waveguide characteristics and the coupling efficiency. A double modulation of the cavity length reduces the measurement uncertainty, and provides a measurement precision better than 0.1 dB, corresponding to 0.02 dB/cm in case of a 5 cm long waveguide.

引用

页码：1244 / 1247

页数：4

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