DETERMINATION OF RARE-EARTH ELEMENTS IN 1L SILICATE REFERENCE SAMPLES BY SECONDARY ION MASS-SPECTROMETRY USING CONVENTIONAL ENERGY FILTERING TECHNIQUE

被引：32

作者：

BOTTAZZI, P ^{[1
]}

OTTOLINI, L ^{[1
]}

VANNUCCI, R ^{[1
]}

机构：

[1] CNR,DIPARTIMENTO SCI TERRA,I-27100 PAVIA,ITALY

来源：

GEOSTANDARDS NEWSLETTER | 1991年 / 15卷 / 01期

关键词：

D O I：

10.1111/j.1751-908X.1991.tb00095.x

中图分类号：

P [天文学、地球科学];

学科分类号：

07 ;

摘要：

Rare earth elements were determined by secondary ion mass spectrometry for 13 silicate rock samples, ranging from ultramafic-mafic to acidic compositions, 2 feldspar and 1 biotite separates. As a whole, the investigated samples are characterized by matrices and rare earth elements spectra covering most geological applications. The present data are compared with reference values. The advantage of using secondary ion mass spectrometry as a fundamental tool for trace element detection in bulk samples in the few ppm-ppb region is demonstrated.

引用

页码：51 / 57

页数：7

共 22 条

[1] BOTTAZZI P, 1990, SECONDARY ION MASS S, V7, P413
[2] Govindaraju K., 1989, GEOSTANDARD NEWSLETT, V13, P1, DOI [10.1111/j.1751-908x.1989.tb00476.x, DOI 10.1111/J.1751-908X.1989.TB00476.X]
[3] DETERMINATION OF THE RARE-EARTH ELEMENTS AND YTTRIUM IN 37 INTERNATIONAL SILICATE REFERENCE MATERIALS BY INDUCTIVELY COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY
JARVIS, KE
JARVIS, I
[J]. GEOSTANDARDS NEWSLETTER, 1988, 12 (01): : 1 - 12
[4] STABILIZATION OF CHARGE ON ELECTRICALLY INSULATING SURFACES DURING SIMS EXPERIMENTS - EXPERIMENTAL AND THEORETICAL-STUDIES OF THE SPECIMEN ISOLATION METHOD
LAU, WM
MCINTYRE, NS
METSON, JB
COCHRANE, D
BROWN, JD
[J]. SURFACE AND INTERFACE ANALYSIS, 1985, 7 (06) : 275 - 281
[5] MACRAE ND, 1987, AM MINERAL, V72, P1263
[6] DETERMINATION OF THE RARE-EARTH ELEMENTS IN 13 GSJ SILICATE ROCK REFERENCE SAMPLES BY SECONDARY ION MASS-SPECTROMETRY
MACRAE, ND
WU, TW
[J]. GEOSTANDARDS NEWSLETTER, 1990, 14 (01): : 119 - 125
[7] SUPPRESSION OF MOLECULAR-IONS IN THE SECONDARY ION MASS-SPECTRA OF MINERALS
METSON, JB
BANCROFT, GM
MCINTYRE, NS
CHAUVIN, WJ
[J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) : 181 - 185
[8] MEYER C, 1979, SECONDARY ION MASS S, V2, P67
[9] A COMPARISON OF CONVENTIONAL AND SPECIMEN ISOLATION FILTERING TECHNIQUES FOR THE SIMS ANALYSES OF GEOLOGIC MATERIALS
MUIR, IJ
BANCROFT, GM
METSON, JB
[J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1987, 75 (02): : 159 - 170
[10] QUANTITATIVE MAJOR-ELEMENT AND TRACE-ELEMENT WHOLE-ROCK ANALYSES BY SECONDARY-ION MASS-SPECTROMETRY USING THE SPECIMEN ISOLATION TECHNIQUE
NESBITT, HW
METSON, JB
BANCROFT, GM
[J]. CHEMICAL GEOLOGY, 1986, 55 (1-2) : 139 - 160

← 1 2 3 →