DECONVOLUTION TECHNIQUES IN AUGER ELECTRON SPECTROSCOPY

[1] INTENSITIES OF K-LL AUGER LINES [J]. NUCLEAR PHYSICS, 1963, 44 (03): : 399 - &

[2] MEAN FREE PATH FOR DISCRETE ELECTRON ENERGY LOSSES IN METALLIC FOILS [J]. PHYSICAL REVIEW, 1955, 100 (04): : 1078 - 1083

[3] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[4] MULAIRE WM, 1971, THESIS U MINNESOTA

[5] Mularie W. M., 1970, Surface Science, V19, P469, DOI 10.1016/0039-6028(70)90055-5

[6] OSWALT RC, 1969, THESIS U MINNESOTA

[7] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[8] PATTERSON MS, 1950, P PHYS SOC LOND, V63, P477

[9] ROBINS JL, 1961, P PHYS SOC LONDON, V78, P177

[10] THIN REACTION LAYERS AND SURFACE STRUCTURE OF SILICON(111) [J]. SURFACE SCIENCE, 1969, 15 (01) : 169 - &

[1] INTENSITIES OF K-LL AUGER LINES [J]. NUCLEAR PHYSICS, 1963, 44 (03): : 399 - &

[2] MEAN FREE PATH FOR DISCRETE ELECTRON ENERGY LOSSES IN METALLIC FOILS [J]. PHYSICAL REVIEW, 1955, 100 (04): : 1078 - 1083

[3] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &

[4] MULAIRE WM, 1971, THESIS U MINNESOTA

[5] Mularie W. M., 1970, Surface Science, V19, P469, DOI 10.1016/0039-6028(70)90055-5

[6] OSWALT RC, 1969, THESIS U MINNESOTA

[7] AUGER ELECTRON SPECTROSCOPY OF FCC METAL SURFACES [J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (05) : 2425 - &

[8] PATTERSON MS, 1950, P PHYS SOC LOND, V63, P477

[9] ROBINS JL, 1961, P PHYS SOC LONDON, V78, P177

[10] THIN REACTION LAYERS AND SURFACE STRUCTURE OF SILICON(111) [J]. SURFACE SCIENCE, 1969, 15 (01) : 169 - &