REVIEW - SCANNING HIGH-ENERGY ELECTRON-DIFFRACTION (SHEED) IN MATERIALS SCIENCE

被引:7
作者
TOMPSETT, MF
机构
关键词
D O I
10.1007/BF00550071
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:1069 / &
相关论文
共 20 条
[1]   ELECTRONIC MEASUREMENT OF ELECTRON MICROSCOPE INTENSITIES AND ENERGIES [J].
BRADBURY, GR .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1969, 2 :254-&
[2]   STRUCTURE OF VERY THIN TANTALUM AND MOLYBDENUM FILMS [J].
DENBIGH, PN ;
MARCUS, RB .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (12) :4325-&
[3]   SCANNING ELECTRON DIFFRACTION OBSERVATIONS ON DIFFUSE INNER RINGS FROM VERY THIN VAPOR-DEPOSITED FILMS [J].
DENBIGH, PN ;
DOVE, DB .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (01) :99-&
[4]   SHORT-RANGE ORDER IN AMORPHOUS GETE FILMS [J].
DOVE, DB ;
HERITAGE, MB ;
CHOPRA, KL ;
BAHL, SK .
APPLIED PHYSICS LETTERS, 1970, 16 (03) :138-&
[5]   SCANNING ELECTRON DIFFRACTION ATTACHMENT WITH ELECTRON ENERGY FILTERING [J].
GRACZYK, JF ;
MOSS, SC .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (03) :424-&
[6]   ON SCANNING ELECTRON DIFFRACTION .2. [J].
GRIGSON, CWB ;
TILLETT, PI .
INTERNATIONAL JOURNAL OF ELECTRONICS, 1968, 24 (02) :101-&
[7]   DETERMINATION OF RADIAL DISTRIBUTION FUNCTIONS BY ELASTIC ELECTRON DIFFRACTION [J].
GRIGSON, CWB ;
THOMPSET.MF .
NATURE, 1966, 210 (5031) :86-&
[8]   FILTERED ELECTRON DIFFRACTION MEASUREMENTS FROM THICK POLYCRYSTALLINE METAL FOILS [J].
GRIGSON, CWB ;
TILLETT, PI .
NATURE, 1967, 215 (5101) :617-&
[9]   SCANNING ELECTRON DIFFRACTION OF FILM GROWTH [J].
GRIGSON, CWB ;
DOVE, DB .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1966, 3 (03) :120-&
[10]  
GRIGSON CWB, 1969, ELECTRON BEAM LASE 4