XPS STUDY OF THE REDUCTION OF CERIUM DIOXIDE

被引：600

作者：

ROMEO, M ^{[1
]}

BAK, K ^{[1
]}

ELFALLAH, J ^{[1
]}

LENORMAND, F ^{[1
]}

HILAIRE, L ^{[1
]}

机构：

[1] UNIV STRASBOURG 1, CATALYSE & CHIM SURFACES LAB, CNRS, URA 423, F-67070 STRASBOURG, FRANCE

来源：

SURFACE AND INTERFACE ANALYSIS | 1993年 / 20卷 / 06期

关键词：

D O I：

10.1002/sia.740200604

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

X-ray photoelectron spectroscopy of cerium oxides is discussed. The well-resolved 3d3/2 (5d 6s)0 4f0 2p0 peak at 916.70 eV cannot be used for calculating the amount of reduction because the correlation between its intensity and the concentration of Ce(IV) and Ce(III) species is not linear. We have therefore developed a complete analysis of the whole spectrum. The deconvolution procedure is explained in detail and the method is applied to two examples: a CeO2/Al2O3 sample and a Pd/CeO2 catalyst reduced under hydrogen.

引用

页码：508 / 512

页数：5

共 31 条

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