MEASUREMENT OF THE 4PI-CONFOCAL POINT-SPREAD FUNCTION PROVES 75 NM AXIAL RESOLUTION

被引：118

作者：

HELL, SW

LINDEK, S

CREMER, C

STELZER, EHK

机构：

[1] Light Microscopy Group, Physical Instrumentation Programme, European Molecular Biology Laboratory (EMBL)

来源：

APPLIED PHYSICS LETTERS | 1994年 / 64卷 / 11期

关键词：

D O I：

10.1063/1.111926

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In a 4Pi-confocal microscope the specimen is illuminated and observed coherently from above and below such that the numerical aperture is increased [S. W Hell, European Patent Application 91121368.4 (filed 1990, published 1992), S. W Hell and E. H. K. Stelzer, J. Opt. Soc. Am. A 9, 2159 (1992)]. The point spread functions of 4Pi-confocal and confocal microscopes were measured. Our measurements prove a three- to seven-fold increase of axial resolution, thus opening the prospect for a powerful three-dimensional imaging technique with an axial resolution down to 75 nm.

引用

页码：1335 / 1337

页数：3

共 5 条

[1]

BORN M, 1975, PRINCIPLES OPTICS, P439

[2] PROPERTIES OF A 4PI CONFOCAL FLUORESCENCE MICROSCOPE [J].