X-RAY TO VISIBLE WAVELENGTH RATIOS

被引：327

作者：

DESLATTES, RD ^{[1
]}

HENINS, A ^{[1
]}

机构：

[1] NBS, WASHINGTON, DC 20234 USA

来源：

关键词：

D O I：

10.1103/PhysRevLett.31.972

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：972 / 975

页数：4

共 18 条

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[4] SELECTION OF W K ALPHA1 AS X-RAY WAVELENGTH STANDARD
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[5] BEARDEN JA, 1971, NBS343 SPEC PUBL, P251
[6] AN X-RAY INTERFEROMETER WITH LONG SEPARATED INTERFERING BEAM PATHS (E)
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[J]. APPLIED PHYSICS LETTERS, 1965, 7 (04) : 99 - &
[7] BONSE U, 1971, NBS343 SPEC PUBL, P291
[8] COHEN EL, TO BE PUBLISHED
[9] CURTIS I, 1971, NBS343 SPEC PUBL, P285
[10] SINGLE AXIS 2 CRYSTAL X-RAY INSTRUMENT
DESLATTES, RD
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1967, 38 (06) : 815 - +