HIGH-RESOLUTION MEASUREMENTS OF ATOMIC AND MOLECULAR LIFETIMES USING HIGH-FREQUENCY DEFLECTION TECHNIQUE

被引：93

作者：

ERMAN, P ^{[1
]}

机构：

[1] RES INST PHYS, S-10405 STOCKHOLM, SWEDEN

来源：

关键词：

D O I：

10.1088/0031-8949/11/2/001

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：65 / 78

页数：14

共 62 条

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