VANDERWAALS INTERACTIONS BETWEEN SHARP PROBES AND FLAT SAMPLE SURFACES

被引:104
作者
HARTMANN, U
机构
[1] Institute for Thin Film and Ion Technology, Forschungszentrum J̈lich G.m.b.H.
来源
PHYSICAL REVIEW B | 1991年 / 43卷 / 03期
关键词
D O I
10.1103/PhysRevB.43.2404
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Based on rigorously macroscopic arguments, a theory of van der Waals interactions between probes of various geometries and a flat sample surface is derived. While the spatial resolution of force sensing is shown to depend solely on probe geometry and probe-sample spacing, the magnitude of the force is additionally determined by the dielectric permittivities of probe, sample, and surrounding mediums. Polar immersion liquids considerably reduce van der Waals forces and may cause a transition from attractive or repulsive interactions. Apart from emphasizing some fundamental aspects, the derived results are of certain relevance to long-range scanning force microscopy.
引用
收藏
页码:2404 / 2407
页数:4
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