TWIN-FREE SINGLE-CRYSTAL GROWTH OF NDGAO3

被引:19
作者
SASAURA, M
MIYAZAWA, S
机构
[1] NTT LSI Laboratories, Atsugi-shi, Kanagawa, 243-01, 3-1, Morinosato Wakamiya
关键词
D O I
10.1016/0022-0248(93)90189-4
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Czochralski growth of NdGaO3 single crystal is investigated. Temperature conditions during crystal growing and cooling are important in eliminating a multitude of twins and cracks. Entirely crack- and twin-free single crystals of less than 40 mm in diameter can be grown under optimized temperature conditions. Growth habits mainly consist of {112} surfaces. The best full width at half maximum of a double-crystal X-ray diffraction peak is 25-30 arc sec, and the etch pit density is approximately 10(4) cm-2. Twin-free Nd0.8La0.2GaO3 single crystal is also grown successfully under the same temperature conditions.
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页码:413 / 418
页数:6
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