PRECISION AND DETECTION LIMITS OF CERTAIN MINOR AND TRACE ELEMENTS IN SILICATES BY ELECTRON MICROPROBE ANALYSIS

被引：11

作者：

HEIDEL, RH

机构：

来源：

关键词：

D O I：

10.1021/ac60307a033

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1907 / &

共 14 条

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[2]

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[3]

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[5]

HEIDEL RH, 1971, 10 NAT M SOC APPL SP

[6]

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[7]

HEINRICH KFJ, 1969, 5 INT C XRAY OPT MIC, P152

[8]

KEIL K, 1967, FORTSCHR MINERAL, V44, P4

[9]

MYERS AT, 1969, PERSONAL COMMUNICATI

[10]

ROBERTS MR, 1971, PRIVATE COMMUNICATIO