QUANTITATIVE-ANALYSIS OF INTEGRATED-OPTIC WAVE-GUIDE SPECTROMETERS

被引：16

作者：

DERI, RJ

KALLMAN, JS

DIJAILI, SP

机构：

[1] Lawrence Livermore National Laboratory, Livermore, CA 94550

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 1994年 / 6卷 / 02期

关键词：

D O I：

10.1109/68.275438

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We show how scalar diffraction theory can be used to quantitatively evaluate insertion losses in integrated optic spectrometers based on planar waveguide and etched grating technologies. This approach is applied to optimize the loss-limited spectral operating range of these devices. We also show how limitations in the photolithographic process used for grating definition can result in appreciable spectrometer insertion losses.

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收藏

页码：242 / 244

页数：3

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