INVESTIGATIONS OF FUNDAMENTAL PROPERTIES OF THE SILVER-SILVER IODIDE FILM ELECTRODE

A study is presented of the basic physicochemical properties of vacuum deposited silver/silver iodide film electrodes. X-ray analysis and electron microscopy yield information on the crystal structure and morphology of these films. The AgI was predominantly present in the γ modification. On the AgI surface irregularities are observed with diameters of 100 nm and lower. Aged surfaces show smaller irregularities than non-aged surfaces. The total roughness factor is estimated at 1.5 with an uncertainty of at least 10%. Methods are presented to determine the average film thickness and the conductivity of the film. The films used have a thickness of about 350 nm. The specific conductivity of the AgI film is approximately 10-4 Ω-1 cm-1. © 1979 Elsevier Sequioa S.A., Lausanne.