MICROCAVITY TRANSVERSE COHERENCE LENGTH AND MICROLASER THRESHOLD

被引：13

作者：

AIELLO, A ^{[1
]}

DEMARTINI, F ^{[1
]}

MARROCCO, M ^{[1
]}

MATALONI, P ^{[1
]}

机构：

[1] IST NAZL FIS NUCL,I-00185 ROME,ITALY

来源：

OPTICS LETTERS | 1995年 / 20卷 / 13期

关键词：

D O I：

10.1364/OL.20.001492

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The concept of transverse coherence length in an active microscopic cavity is investigated with regard to the threshold of the microlaser action. This physical parameter is related to the Linear spatial extent, or the effective radius, of the transverse lasing mode operating in a plane Fabry-Perot microcavity. This problem is analyzed by means of a full semiclassical theory, by which the microlaser threshold is expressed as a function of the relevant parameters of the thresholdless microlaser and of the extension of the active pumped zone. Experimental results are in satisfactory agreement with the theoretical predictions.

引用

页码：1492 / 1494

页数：3

共 12 条

[1]

AIELLO A, 1994, ULTRAFAST PHENOMENA, V60, P109

[2] ANALYTIC EXPRESSIONS FOR THE REFLECTION DELAY, PENETRATION DEPTH, AND ABSORPTANCE OF QUARTER-WAVE DIELECTRIC MIRRORS [J].