PULSE-MODULATED INTERFEROMETER FOR MEASURING INTENSITY-INDUCED PHASE-SHIFTS

被引：12

作者：

ROCHFORD, KB ^{[1
]}

ZANONI, R ^{[1
]}

STEGEMAN, GI ^{[1
]}

KRUG, W ^{[1
]}

MIAO, E ^{[1
]}

BERANEK, MW ^{[1
]}

机构：

[1] BOEING AEROSP & ELECTR,CTR HIGH TECHNOL,SEATTLE,WA 98124

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1992年 / 28卷 / 10期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1109/3.159514

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Single-polarization interferometric measurements of intensity-induced refractive index changes using an intensity-modulated mode-locked laser are reported. The technique is used to determine the electronic and thermal intensity-dependent index changes in a polydiacetylene waveguide. Monte Carlo analysis shows that a sensitivity of at least 0.02 radians is expected from the present configuration.

引用

页码：2044 / 2050

页数：7

共 16 条

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