T-MATRIX FORMALISM OF LOW-ENERGY ELECTRON-DIFFRACTION FOR CLEAN AND OVERLAYER SYSTEMS

被引：8

作者：

TONG, SY

RHODIN, TN

TAIT, RH

机构：

[1] CORNELL UNIV,SCH APPL & ENGN PHYS,ITHACA,NY 14850

[2] CORNELL UNIV,DEPT PHYS,ITHACA,NY 14850

来源：

SURFACE SCIENCE | 1973年 / 34卷 / 02期

关键词：

D O I：

10.1016/0039-6028(73)90130-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：457 / 463

页数：7

共 10 条

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[2]

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[4] ION CORE SCATTERING AND LOW ENERGY ELECTRON DIFFRACTION .2. [J].

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[5]

PENDRY JB, 1971, J PHYS PART C SOLID, V4, P2501, DOI 10.1088/0022-3719/4/16/015

[6] LOW-ENERGY ELECTRON-DIFFRACTION INTENSITY CALCULATIONS WITH A REALISTIC CRYSTAL POTENTIAL [J].

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JONES, RO .

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[7] NEW PERTURBATIVE APPROACH TO APPLICATION OF LOW-ENERGY ELECTRON-DIFFRACTION - T-MATRIX FORMALISM [J].

TAIT, RH ;

TONG, SY ;

RHODIN, TN .

PHYSICAL REVIEW LETTERS, 1972, 28 (09) :553-&

[8] INTERPRETATION OF LOW-ENERGY ELECTRON-DIFFRACTION SPECTRA FOR A FREE-ELECTRON METAL IN TERMS OF MULTIPLE SCATTERING INVOLVING STRONG INELASTIC DAMPING [J].

TONG, SY ;

RHODIN, TN .

PHYSICAL REVIEW LETTERS, 1971, 26 (12) :711-&

[9]

TONG SY, IN PRESS

[10] BAND STRUCTURE OF METALLIC COPPER AND NICKEL BY A SELF-CONSISTENT PROCEDURE [J].

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JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1965, 20 (10) :1894-&

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