CRYSTALLINE AND CHEMICAL-QUALITY OF CDTE AND CD1-XZNXTE GROWN BY THE BRIDGMAN METHOD IN LOW-TEMPERATURE GRADIENTS

被引：53

作者：

MUHLBERG, M

RUDOLPH, P

GENZEL, C

WERMKE, B

BECKER, U

机构：

[1] Bereich Kristallographie, Sektion Physik der Humboldt-Universität zu Berlin, DDR-1040 Berlin

来源：

JOURNAL OF CRYSTAL GROWTH | 1990年 / 101卷 / 1-4期

关键词：

15;

D O I：

10.1016/0022-0248(90)90981-P

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

CdTe and (Cd, Zn)Te grown by the vertical Bridgman method in low temperature gradients have been investigated with respect to the structural perfection using X-ray double crystal topography and an etching technique. Furthermore, information on the axial distribution has been obtained by means of lattice constant and infrared transmittance measurements, respectively. © 1989.

引用

页码：275 / 280

页数：6

共 15 条

[1] OPTICAL STUDY OF THE IMPURITY DISTRIBUTION IN VERTICAL BRIDGMAN-GROWN CDTE CRYSTALS [J].