HIGH-FREQUENCY SCATTERING BY A RESISTIVE STRIP AND EXTENSIONS TO CONDUCTIVE AND IMPEDANCE STRIPS

被引:53
作者
HERMAN, MI
VOLAKIS, JL
机构
[1] Univ of Michigan, Ann Arbor, MI, USA, Univ of Michigan, Ann Arbor, MI, USA
关键词
DIELECTRIC MATERIALS - Electric Properties;
D O I
10.1029/RS022i003p00335
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
An asymptotic solution is presented for the diffraction by a resistive strip which is useful in the simulation of thin dielectric layers. Up to third-order diffraction terms are derived which include the surface wave field effects in a uniform manner. Extensions to the case of conductive and impedance strips are also given. The derivation of the higher order terms is based on the extended spectral ray method. New first-order diffraction coefficients for the impedance, resistive and conductive half planes are presented. The last are uniform everywhere, including the surface wave field boundaries.
引用
收藏
页码:335 / 349
页数:15
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