MEASUREMENT OF STRESS-INDUCED BIREFRINGENCE OF BI12GEO20 SINGLE-CRYSTALS BY A NEW ELLIPSOMETRY

被引：3

作者：

MIKAMI, N

NAGAO, C

SAWADA, T

SATO, K

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1987年 / 26卷

关键词：

D O I：

10.7567/JJAPS.26S2.152

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：152 / 155

页数：4

共 5 条

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[2] TRANSPORT PROCESSES OF PHOTOINDUCED CARRIERS IN BI12SIO20
HOU, SL
LAUER, RB
ALDRICH, RE
[J]. JOURNAL OF APPLIED PHYSICS, 1973, 44 (06) : 2652 - 2658
[3] KYUMA K, 1983, J LIGHTWAVE TECHNOL, V1, P93
[4] TRANSIENT PHOTOCURRENT INDUCED BY NANOSECOND LIGHT-PULSES IN BSO AND BGO
LESAUX, G
LAUNAY, JC
BRUN, A
[J]. OPTICS COMMUNICATIONS, 1986, 57 (03) : 166 - 170
[5] ABSORPTION CENTERS OF BI12GEO20 AND BI12SIO20 CRYSTALS
OBERSCHMID, R
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 89 (01): : 263 - 270